A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...

Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

image: THE INTRODUCTION OF DEFECTS INTO ELECTRODE MATERIALS FOR METAL-BASED BATTERIES IS AN EFFECTIVE STRATEGY TO IMPROVE BATTERY PERFORMANCE, DUE TO DEFECTIVE CATALYSTS HAVE THE ADVANTAGES OF HIGH ...

• The underlying migration mechanism of Mg 2+ in cathode materials and roles of defects in Mg 2+ migration in cathode materials were studied. • Applications of defect engineering to Mg 2+ migration in ...

A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...

In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth USD 7661 Million and is forecast ...