Electronic Design

Design for Test: ATPG keeps pace with design complexity

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
Design-Reuse

BIST versus ATPG -- separating myths from reality

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...
PR TIMES

メンターのTessent VersaPointテストポイント技術、ルネサス ...

メンターが、製造テストにかかるコストを削減しつつインシステムテストの品質を向上させるTessent VersaPointを発表し、同テストポイント技術をルネサス エレクトロニクスが採用。 メンター，シーメンス・ビジネス（以下メンター）は、ISO 26262準拠認定済み ...
Design-Reuse

An Introduction about ATPG in VLSI

VLSI or Very Large Scale Integration has emerged as a crucial field in electronics engineering over the past few years. With the manufacture of complex integrated circuits (ICs) with millions of ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

Scalable End-To-End Test Solutions For Today’s Complex SoCs

Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...
New Electronics

Test pattern generation package updated, certified to ISO26262

Synopsys has announced its latest automatic test pattern generation and diagnostics package. Called TetraMAX II, the software is said to incorporate test engines announced in October 2015. Supporting ...