ATPG（automatic test pattern generator）は，論理LSIテスターで使うテスト・パターンを自動生成するEDAツール。現在のATPGが主に対象にするのは，機能テスト（ファンクション・テスト）を代替する構造テスト用のテスト・パターンである。 論理合成の登場で注目率 ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

Abstract: The benefits of Cell-Aw are Test Methodology in today's SOC for better quality of ATPG testing is well known. It overcomes the limitations of traditional fault models by targeting specific ...

This tool's main algorithm is implemented based on the following paper: Fujiwara and Shimono, "On the Acceleration of Test Generation Algorithms," in IEEE Transactions on Computers, vol. C-32, no. 12, ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

Advanced ATPG products support simultaneous analysis of multiple fault models, leverage multi-threading and on-chip compression to improve quality and reduce turnaround time and costs of nanometer ICs ...

A project-ready Python tool that evaluates ATPG pattern effectiveness against fault models. It detects overlapping fault coverage, identifies inefficient vectors, recommends pruning candidates, and ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...