TOKYO, Dec 6, 2023 - (JCN Newswire) - Hitachi High-Tech Corporation announced today the launch of the Hitachi Dark Field Wafer Defect Inspection System DI4600 – a new tool for inspecting particles and ...

The chip industry is conservative when it comes to adopting new metrology and inspection. Will it ultimately see NVD inspection as a wunderkind, or an also-ran? Remember when it first became obvious ...

For a long time, semiconductor defect inspection focused on particles, and particle defects remain an important cause of yield loss. But as devices have become more complex, additional kinds of ...

MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...

Abstract: The semiconductor industry is rapidly developing, and fabrication facilities demand higher standards for the surface quality inspection of patterned wafers. In this paper, a multi-angle ...

Inspecting subwavelength defects in dense nanopatterns is hindered by weak signals and strong background noise. Researchers ...

Abstract: Automatic welding technology has been widely applied in the field of industrial production. In promoting high-quality intelligent manufacturing processes for the consumer market, precise ...

San Francisco, CA. KLA-Tencor today announced two new defect-inspection products, addressing key challenges in tool and process monitoring during silicon wafer and chip manufacturing at the ...