Citation: Shear, B. R., Whitfield, E., & Nath, K. (2025). Investigating the relationship between sample size and reliability of aggregate test score measures in Colorado schools. Boulder, CO: The ...

KAWASAKI, Japan--(BUSINESS WIRE)--Toshiba Electronic Devices & Storage Corporation (“Toshiba”) has developed "X5M007E120," a bare die [1] 1200V silicon carbide (SiC) MOSFET for automotive traction ...