Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

Boundary Scan technique is most often thought of as a board-level test method, but certain techniques makes system level test with JTAG quite effective. Many types of faults can arise when systems are ...

Yield improvement at sub 100-nm technologies relies on the latest scan test techniques. As IC feature sizes shrink below 90 nm, in-line inspection techniques to determine yield-limiting problems ...

Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...

Astrotech Corporation has launched a new subsidiary, EN-SCAN, Inc., focused on manufacturing and selling advanced environmental testing instruments utilizing its proprietary gas chromatography and ...

“Traditional GC and MS field monitoring requires sample collection, transport to expensive remote labs, then often days or even weeks to get results due to backlog — by which time the data is outdated ...