Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...

NEW YORK -- The Magazine Retail Advisory Council here was expected by early this week to release a document that will provide some guidelines for the testing of scan-based trading of magazines at ...

In the critical process known as new-product bring-up, it’s a race to get new products to yield as quickly as possible. But the interplay between increasingly complex aspects of designs and process ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Birgitta Böckeler, Distinguished Engineer at ...

TOKYO, Japan -- June 17, 2021 -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) is pilot testing a next-generation solution for performing both high-speed scan testing ...

Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...

Astrotech Corporation has launched a new subsidiary, EN-SCAN, Inc., focused on manufacturing and selling advanced environmental testing instruments utilizing its proprietary gas chromatography and ...