NEW YORK -- The Magazine Retail Advisory Council here was expected by early this week to release a document that will provide some guidelines for the testing of scan-based trading of magazines at ...

Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

Some supermarkets are taking a few hesitant steps toward scan-based trading of magazines, but many in the industry are starting to question whether the system, in which retailers pay for their ...

A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...