NEW YORK -- The Magazine Retail Advisory Council here was expected by early this week to release a document that will provide some guidelines for the testing of scan-based trading of magazines at ...

Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Birgitta Böckeler, Distinguished Engineer at ...