A theme of this month’s column is education. Most of the sites I’ve covered this month have a strong educational component and Principle of Scanning Probe Microscopy is no exception. With content ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

Scanning thermal microscopy (SThM) has emerged as a pivotal nanoscale characterisation tool to elucidate local thermal properties in advanced materials. By utilising a specialised probe integrated ...

This webinar will cover three widely used high-resolution microscopy techniques that deliver nanoscale insights: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

The work was supported by the World Premier International Research Center Initiative (WPI), MEXT, Japan, JSPS Grants-in-Aid for Scientific Research (21H01770, 22K04890). The principle of scanning ion ...